مرکز منطقه ای اطلاع رساني علوم و فناوري - Special issue on breakdown in advanced gate dielectrics

DocumentCode :

818785

Title :

Special issue on breakdown in advanced gate dielectrics

Volume :

Issue :

fYear :

2005

fDate :

6/1/2005 12:00:00 AM

Firstpage :

1226

Lastpage :

1226

Abstract :

Provides notice of upcoming special issue(s) of interest to practitioners and researchers.

fLanguage :

English

Journal_Title :

Electron Devices, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/TED.2005.850584

Filename :

1433122

Link To Document :