Title :
EMF migration between Shapiro steps on pbInAu/oxide/PbAu junctions under constant current biases
Author :
Imagaki, K. ; Sakamoto, Yasuhiko ; Sakuraba, Toshiaki ; Endo, Tadashi
Author_Institution :
Electrotechnical Laboratory
fDate :
4/1/1991 12:00:00 AM
Keywords :
Circuits; Degradation; Electrodes; Electron traps; Fluctuations; Gold; Helium; Josephson junctions; Time measurement; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1990.1032942
