DocumentCode

818809

Title

EMF migration between Shapiro steps on pbInAu/oxide/PbAu junctions under constant current biases

Author

Imagaki, K. ; Sakamoto, Yasuhiko ; Sakuraba, Toshiaki ; Endo, Tadashi

Author_Institution

Electrotechnical Laboratory

Volume

40

Issue

2

fYear

1991

fDate

4/1/1991 12:00:00 AM

Firstpage

295

Lastpage

297

Keywords

Circuits; Degradation; Electrodes; Electron traps; Fluctuations; Gold; Helium; Josephson junctions; Time measurement; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.1990.1032942

Filename

1032942