DocumentCode :
818811
Title :
Computer-Aided Design for Low-Power Robust Computing in Nanoscale CMOS
Author :
Sylvester, Dennis ; Srivastava, Ashish
Author_Institution :
Michigan Univ., Ann Arbor, MI
Volume :
95
Issue :
3
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
507
Lastpage :
529
Abstract :
This work argues that the foremost challenges to the continued rapid improvements in CMOS integrated circuit (IC) performance are power consumption and design robustness. Furthermore, these two goals are often contradictory in nature, which indicates that joint optimization approaches must be adopted to properly handle both. To highlight needs in computer-aided design (CAD), we review a sampling of state-of-the-art work in power reduction techniques, and also in the newly emerging area of statistical optimization applied to very large scale integration (VLSI) ICs. The lack of CAD techniques to perform multiobjective function optimization (specifically parametric yield under correlated performance metrics) is a major limitation of current CAD research. In addition, with design trends pushing towards architectures based on aggressive adaptivity and voltage scaling, CAD researchers and engineers will need to refocus efforts on enabling this type of complex design
Keywords :
CMOS integrated circuits; circuit CAD; circuit optimisation; integrated circuit design; low-power electronics; sampling methods; CAD; VLSI integrated circuit; aggressive adaptivity; computer-aided design; design trends; joint optimization approaches; low-power robust computing; multiobjective function optimization; nanoscale CMOS integrated circuit; parametric yield; power reduction; statistical optimization; voltage scaling; CMOS integrated circuits; Design automation; Design engineering; Design optimization; Energy consumption; Measurement; Robustness; Sampling methods; Very large scale integration; Voltage; CMOS; integrated circuits; low-power; parametric yield;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/JPROC.2006.889370
Filename :
4167780
Link To Document :
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