• DocumentCode
    818830
  • Title

    Scalable Model of On-Wafer Interconnects for High-Speed CMOS ICs

  • Author

    Shi, Xiaomeng ; Yeo, Kiat Seng ; Ma, Jian-Guo ; Do, Manh Anh ; Li, Erping

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ.
  • Volume
    29
  • Issue
    4
  • fYear
    2006
  • Firstpage
    770
  • Lastpage
    776
  • Abstract
    This paper describes the development of an equivalent circuit model of on-wafer interconnects for high-speed CMOS integrated circuits. By strategically cascading two-pi blocks together, the lumped model can characterize the distributed effects. Besides, the elaborately proposed model characterizes the frequency-variant characteristics with frequency-independent components. Thus, the model can be easily plugged into commercial computer-aided design tools. By adopting a newly invented optimization algorithm, namely, particle swarm optimization (PSO), the model parameters are extracted and formulated as empirical expressions. Therein, with each set of the geometrical parameters, the interconnect behaviors can be accurately predicted. The accuracy of the model is validated by comparisons with the on-wafer measurements up to 30 GHz. Moreover, the scalability of the proposed model is also discussed
  • Keywords
    CMOS integrated circuits; equivalent circuits; integrated circuit packaging; particle swarm optimisation; empirical formulas; high speed CMOS IC; lumped equivalent circuit model; on wafer interconnects; particle swarm optimization; scalable model; scattering parameter measurements; Accuracy; CMOS integrated circuits; Design automation; Equivalent circuits; Frequency; Integrated circuit interconnections; Integrated circuit modeling; Particle swarm optimization; Scalability; Semiconductor device modeling; CMOS interconnects; empirical formulas; lumped equivalent circuit model; particle swarm optimization; scalable; scattering parameter measurements;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2006.884781
  • Filename
    4012262