Title :
SEU sensitivity of virtex configuration logic
Author :
Alderighi, M. ; Candelori, A. ; Casini, F. ; Angelo, S.D. ; Mancini, M. ; Paccagnella, A. ; Pastore, S. ; Sechi, G.R.
Author_Institution :
Inst. di Astrofisica Spaziale e Fisica Cosmica, Inst. Nazionale di Astrofisica, Milano, Italy
Abstract :
This paper presents a strategy of investigation of SEU upset mechanisms in the configuration logic of Virtex I devices. Measurement procedures specifically addressing configuration logic and a hardware set up for radiation testing are described. The results of a heavy ion radiation test are then presented. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.
Keywords :
field programmable gate arrays; ion beam effects; failure mechanisms; field programmable gate arrays; heavy ion radiation test; radiation effects; semiconductor device radiation testing; single event upset; virtex configuration logic; Circuit faults; Extraterrestrial measurements; Failure analysis; Field programmable gate arrays; Hardware; Logic devices; Logic testing; Programmable logic arrays; Single event upset; Vehicle dynamics; Field programmable gate arrays (FPGA); heavy ion radiation effects; radiation effects; semiconductor device radiation testing; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.860741
