Laser Simulation of single event effects in pulse width Modulators

Author

Chugg, A.M. ; Jones, R. ; Moutrie, M.J. ; Duncan, P.H. ; Sorensen, R. Harboe ; Mattsson, S. ; Larsson, S. ; Fitzgerald, R. ; Shea, T.O.

Author_Institution

Radiat. Effects Group, MBDA UK Ltd., Bristol, UK

Volume

52

Issue

6

fYear

2005

Firstpage

2487

Lastpage

2494

Abstract

Laser testing assists in identifying the sources of pulse width modulator (PWM) single event effect (SEE) sensitivity and reveals new details of PWM SEE behavior, such as enhanced sensitivity during output switching and delayed onset of latch-up near the single-event latch-up threshold. In combination with analysis to map PWM circuitry in the microchip dies, laser SEE test results provide insights into the mechanisms of the SEE events.

Keywords

laser beam effects; optical modulation; pulse width modulation; laser simulation; laser testing; microchip dies; pulse width modulators; single event effects; single-event latch-up threshold; Circuit testing; Delay effects; Discrete event simulation; Feedback loop; Laser feedback; Microchip lasers; Optical pulses; Pulse width modulation; Space technology; Space vector pulse width modulation; Laser simulation; pulse width modulator (PWM); single-event effects (SEE); single-event latchup (SEL); single-event transient (SET);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2005.860721

Filename

1589228