DocumentCode :
818951
Title :
The ultra-Zener- a portable replacement for the Western cell?
Author :
Spreadbury, Peter J.
Author_Institution :
Cambridge University
Volume :
40
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
343
Lastpage :
346
Keywords :
Aging; Assembly; Circuit testing; Integrated circuit noise; Low-frequency noise; Printed circuits; Semiconductor device measurement; Temperature; Thermal resistance; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1990.1032955
Filename :
1032955
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=818951
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