DocumentCode :
819037
Title :
Bloch-wave engineering for high-Q, small-V microcavities
Author :
Lalanne, Ph. ; Hugonin, Jean Paul
Author_Institution :
Centre Nat. de la Recherche Scientifique, Univ. Paris Sud, Orsay, France
Volume :
39
Issue :
11
fYear :
2003
Firstpage :
1430
Lastpage :
1438
Abstract :
The overall decay rate of the mode in an optical microcavity formed by a defect surrounded by two Bragg mirrors in a monomode waveguide is driven by two mechanisms, the desired coupling to a guided mode and the detrimental coupling to radiation modes. We propose two approaches fully compatible with planar fabrication, which allow to increase the cavity Q´s by several orders of magnitude while keeping constant the mode volume V of the cavity. The first approach consists of engineering the mirror to taper the guided mode into the mirror Bloch mode, thus decreasing losses. The second approach is less intuitive and relies on a recycling mechanism of the radiation losses. The study is supported by computational results obtained for two-dimensional silicon-on-insulator geometries, but the results apply as well to other related geometries like three-dimensional photonic-wire cavities.
Keywords :
Q-factor; distributed Bragg reflectors; micro-optics; microcavities; mirrors; optical planar waveguides; optical resonators; photonic crystals; silicon-on-insulator; Bloch-wave engineering; Si; cavity Q; decay rate; defect; desired coupling; detrimental coupling; guided mode; high-Q small-V microcavities; losses; mirror Bloch mode; mode volume; monomode waveguide; optical microcavity; planar fabrication; radiation losses; radiation modes; recycling mechanism; three-dimensional photonic-wire cavities; two Bragg mirrors; two-dimensional silicon-on-insulator geometries; Computational geometry; Microcavities; Mirrors; Optical computing; Optical coupling; Optical device fabrication; Optical losses; Optical waveguides; Recycling; Silicon on insulator technology;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2003.818283
Filename :
1242362
Link To Document :
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