Title :
Correlation between noise-after-write and magnetization dynamics in thin film heads
Author :
Liu, F.H. ; Ryan, P. ; Shi, X. ; Kryder, M.H.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
Correlation between noise-after-write and magnetization dynamics in 30-turn electroplated thin-film heads has been investigated by utilizing two complementary magnetooptic Kerr-effect domain imaging systems and a Barkhausen noise tester. It has been found that heads containing spike-like domains near the backgap closure have significantly higher noise-after-write rates than heads with normal closure domain configurations. A longitudinal 180° wall in the direction of flux conduction at the sloped region of the pole tip was observed, however, regardless of whether the head had a high or low noise-after-write rate
Keywords :
Barkhausen effect; Kerr magneto-optical effect; electroplated coatings; magnetic domain walls; magnetic heads; magnetic thin film devices; noise; Barkhausen noise tester; backgap closure; closure domain configurations; electroplated heads; longitudinal 180° wall; magnetization dynamics; magnetooptic Kerr-effect domain imaging systems; noise-after-write; pole tip; spike-like domains; thin film heads; Kerr effect; Magnetic domain walls; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Magnetization; Magnetooptic effects; Transistors; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
