DocumentCode
819190
Title
Preferred crystalline orientation of melt-spun Nd-Fe-M -B flakes (M =Ti/Zr/Hf/V/Nb/Ta)
Author
Chin, Tsung-Shune ; Huang, S.H. ; Yao, J.M.
Author_Institution
Dept. of Mater. Sci. & Eng., Tsing Hua Univ., Hsinchu, Taiwan
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
2136
Lastpage
2138
Abstract
The preferred crystalline orientation of melt-spun Nd13Fe80-xM xB6 flakes (M =0.5 to 3 at.% of Ti, Zr, Hf, V, Nb, or Ta) prepared by single roller melt spinning were studied by X-ray diffractometry, microstructure, and magnetic measurements. Certain alloying elements, M =Ti, Zr, V, and Ta, enhance both preferred crystalline orientation and coercivity at moderate wheel speeds V s , typically 8 to 15 m/s. The degree of preferred orientation calculated from X-ray diffraction patterns is a higher than 50% across the whole thickness, at V s=8 and 10 m/s, despite the apparent equiaxed grains. Magnetic measurements on spun flakes and field aligned pulverized powders show highly anisotropic behavior. They have potential applications for anisotropic resin bond magnets
Keywords
X-ray diffraction examination of materials; alloying additions; boron alloys; coercive force; crystal microstructure; crystal orientation; ferromagnetic properties of substances; hafnium alloys; iron alloys; melt spinning; neodymium alloys; niobium alloys; permanent magnets; tantalum alloys; titanium alloys; vanadium alloys; zirconium alloys; 8 to 15 m/s; Nd13Fe80-xHfxB6; Nd13Fe80-xNbxB6; Nd13Fe80-xTaxB6; Nd13Fe80-xTixB6; Nd13Fe80-xVxB6; Nd13Fe80-xZrxB6; X-ray diffraction patterns; X-ray diffractometry; anisotropic resin bond magnets; coercivity; equiaxed grains; field aligned pulverized powders; magnetic measurements; melt spun flakes; microstructure; preferred crystalline orientation; single roller melt spinning; wheel speeds; Anisotropic magnetoresistance; Crystallization; Hafnium; Iron; Magnetic variables measurement; Neodymium; Niobium; Spinning; X-ray diffraction; Zirconium;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179421
Filename
179421
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