Title :
Statistical methods for large flight lots and ultra-high reliability applications
Author :
Ladbury, R. ; Gorelick, J.L.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present statistical techniques for evaluating random and systematic errors for use in flight performance predictions for large flight lots and ultra-high reliability applications.
Keywords :
aircraft; radiation effects; reliability; statistical distributions; flight lots; flight performance predictions; radiation effects; random errors; statistical distributions; systematic errors; ultrahigh reliability applications; NASA; Pathology; Quality assurance; Sampling methods; Statistical analysis; Statistical distributions; Tail; Testing; Thermal stresses; Voltage; Probability; quality assurance; radiation effects; reliability estimation; statistics;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.861080
