Radiation effects on astrometric CCDs at low operating temperatures

Author

Hopkinson, Gordon R. ; Short, Alexander ; Vetel, Cyril ; Zayer, Igor ; Holland, Andrew D.

Author_Institution

Eur. Space Agency, Noordwijk, Netherlands

Volume

52

Issue

6

fYear

2005

Firstpage

2664

Lastpage

2671

Abstract

Emission times of proton-induced traps and optical spot profiles have been measured at temperatures around -110°C for large format charge-coupled devices (CCDs), representative of those to be used for the Gaia mission. There are at least seven trap species involved, with emission times in the range 0.3 μs to 130 s and there is evidence for charge re-trapping by fast traps. Trap filling using a charge injection gate is discussed.

Keywords

astrometry; charge exchange; charge injection; charge-coupled devices; radiation effects; 110 C; Gaia mission; astrometric charge-coupled devices; charge injection gate; charge retrapping; charge transfer efficiency; emission times; optical spot profiles; proton-induced traps; radiation effects; Charge carrier processes; Charge coupled devices; Charge transfer; Predictive models; Protons; Radiation effects; Satellites; Space technology; Stimulated emission; Temperature measurement; Charge-coupled device (CCD); Gaia; NIEL; charge transfer efficiency (CTE); displacement damage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2005.860734

Filename

1589254