DocumentCode
819854
Title
Direct measurement of the sensitivity distribution of magnetoresistive heads by the SXM technique
Author
Sueoka, K. ; Wago, K. ; Sai, F.
Author_Institution
IBM Tokyo Res. Lab., Japan
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
2307
Lastpage
2309
Abstract
The sensitivity distribution of a magnetoresistive (MR) head was obtained by using a scanning probe microscope (SXM) technique. This technique made it possible to map with submicron resolution the sensitivity distribution on the air-bearing surface of the MR head in relation to the head structure. It was observed that the shape and location of the sensitivity distribution varied with changes in the sense current. Comparison with microtrack measurements showed qualitatively good agreements
Keywords
electric sensing devices; magnetic force microscopy; magnetic heads; magnetoresistive devices; sensitivity; MFM; air-bearing surface; head structure; magnetic forces microscopy; magnetoresistive heads; microtrack measurements; scanning probe microscope; sense current; sensitivity distribution; submicron resolution; Amorphous magnetic materials; Magnetic anisotropy; Magnetic flux; Magnetic force microscopy; Magnetic heads; Magnetic recording; Magnetoresistance; Perpendicular magnetic anisotropy; Saturation magnetization; Shape;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179477
Filename
179477
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