Title :
Spatial mapping of the sensitivity function of magnetic recording heads using a magnetic force microscope as a local flux applicator
Author :
Gibson, G.A. ; Schultz, S. ; Carr, T. ; Jagielinski, T.
Author_Institution :
Dept. of Phys., California Univ., San Diego, La JoIla, CA, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
A technique for using a magnetic force microscope (MFM) as a local field source for mapping the sensitivity function of magnetic recording heads is described. The results obtained from applying this technique to both magnetoresistive and inductive recording heads are discussed
Keywords :
magnetic force microscopy; magnetic heads; magnetic thin film devices; magnetoresistive devices; sensitivity; MFM; inductive recording heads; local flux applicator; magnetic force microscope; magnetic recording heads; magnetoresistive heads; sensitivity function; spatial mapping; Etching; Magnetic domains; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Magnetization; Wire;
Journal_Title :
Magnetics, IEEE Transactions on
