DocumentCode
819864
Title
Spatial mapping of the sensitivity function of magnetic recording heads using a magnetic force microscope as a local flux applicator
Author
Gibson, G.A. ; Schultz, S. ; Carr, T. ; Jagielinski, T.
Author_Institution
Dept. of Phys., California Univ., San Diego, La JoIla, CA, USA
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
2310
Lastpage
2311
Abstract
A technique for using a magnetic force microscope (MFM) as a local field source for mapping the sensitivity function of magnetic recording heads is described. The results obtained from applying this technique to both magnetoresistive and inductive recording heads are discussed
Keywords
magnetic force microscopy; magnetic heads; magnetic thin film devices; magnetoresistive devices; sensitivity; MFM; inductive recording heads; local flux applicator; magnetic force microscope; magnetic recording heads; magnetoresistive heads; sensitivity function; spatial mapping; Etching; Magnetic domains; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic recording; Magnetization; Wire;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179478
Filename
179478
Link To Document