• DocumentCode
    820039
  • Title

    A Low-Phase Noise, Anti-Harmonic Programmable DLL Frequency Multiplier With Period Error Compensation for Spur Reduction

  • Author

    Du, Qingjin ; Zhuang, Jingcheng ; Kwasniewski, Tad

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Ont.
  • Volume
    53
  • Issue
    11
  • fYear
    2006
  • Firstpage
    1205
  • Lastpage
    1209
  • Abstract
    A low phase noise, delay-locked loop-based programmable frequency multiplier, with the multiplication ratio from 13 to 20 and output frequency range from 900 MHz to 2.9 GHz, is reported in this brief. A new switching control scheme is employed in the circuit to enable the capability of locking to frequencies either above or below the start-up frequency without initialization. To reduce the spurious output power level, a low-bandwidth auxiliary loop [period error compensation loop (PECL)] is employed to compensate for the output period error caused by the phase realignment errors. This frequency multiplier is implemented in TSMC 0.18-mum CMOS technology and measured with a synthesized frequency source. A significant reduction of the output spurs from -23 to -46.5 dB at 1.216 GHz is achieved by enabling the PECL. The measured cycle-to-cycle timing jitter at 2.16 GHz is 1.6 ps (rms) and 12.9 ps (pk-pk), and the phase noise is -110 dBc/Hz at 100-kHz offset with a power consumption of 19.8 mW at a 1.8-V power supply
  • Keywords
    CMOS integrated circuits; delay lock loops; frequency multipliers; integrated circuit design; integrated circuit noise; phase noise; programmable circuits; 0.18 micron; 0.9 to 2.9 GHz; 1.8 V; 19.8 mW; CMOS technology; anti-harmonic programmable DLL frequency multiplier; delay locked loop; low-bandwidth auxiliary loop; period error compensation loop; phase noise; phase realignment errors; spur reduction; switching control scheme; synthesized frequency source; CMOS technology; Delay; Error compensation; Frequency locked loops; Frequency measurement; Frequency synthesizers; Noise reduction; Phase noise; Power generation; Switching circuits; Delay-locked loop (DLL); frequency multiplier; in-lock error; phase noise; phase-locked loop (PLL); spurious power level;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2006.883103
  • Filename
    4012377