DocumentCode :
820144
Title :
Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores
Author :
Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris
Author_Institution :
Comput. Sci. Dept., Ioannina Univ.
Volume :
26
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
1070
Lastpage :
1083
Abstract :
A new test-data compression method suitable for cores of unknown structure is introduced in this paper. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Each Huffman codeword corresponds to three different kinds of information, and thus, significant compression improvements compared to the already known techniques are achieved. A simple architecture is proposed for decoding the compressed data on chip. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Moreover, the major part of the decompressor can be shared among different cores, which reduces the hardware overhead of the proposed architecture considerably. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test sets are replaced by pseudorandom data generated by a linear feedback shift register
Keywords :
Huffman codes; data compression; industrial property; random number generation; shift registers; Huffman codeword; IP cores; embedded testing techniques; intellectual property cores; linear feedback shift register; multilevel Huffman coding; pseudorandom data generation; test-data compression; unmodeled faults; Automatic test pattern generation; Automatic testing; Circuit testing; Computer science; Educational programs; Hardware; Huffman coding; Informatics; Intellectual property; Linear feedback shift registers; Embedded testing techniques; Huffman encoding; intellectual property (IP) cores; linear feedback shift registers (LFSRs); test-data compression;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2006.885830
Filename :
4167987
Link To Document :
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