• DocumentCode
    820144
  • Title

    Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores

  • Author

    Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris

  • Author_Institution
    Comput. Sci. Dept., Ioannina Univ.
  • Volume
    26
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1070
  • Lastpage
    1083
  • Abstract
    A new test-data compression method suitable for cores of unknown structure is introduced in this paper. The proposed method encodes the test data provided by the core vendor using a new, very effective compression scheme based on multilevel Huffman coding. Each Huffman codeword corresponds to three different kinds of information, and thus, significant compression improvements compared to the already known techniques are achieved. A simple architecture is proposed for decoding the compressed data on chip. Its hardware overhead is very low and comparable to that of the most efficient methods in the literature. Moreover, the major part of the decompressor can be shared among different cores, which reduces the hardware overhead of the proposed architecture considerably. Additionally, the proposed technique offers increased probability of detection of unmodeled faults since the majority of the unknown values of the test sets are replaced by pseudorandom data generated by a linear feedback shift register
  • Keywords
    Huffman codes; data compression; industrial property; random number generation; shift registers; Huffman codeword; IP cores; embedded testing techniques; intellectual property cores; linear feedback shift register; multilevel Huffman coding; pseudorandom data generation; test-data compression; unmodeled faults; Automatic test pattern generation; Automatic testing; Circuit testing; Computer science; Educational programs; Hardware; Huffman coding; Informatics; Intellectual property; Linear feedback shift registers; Embedded testing techniques; Huffman encoding; intellectual property (IP) cores; linear feedback shift registers (LFSRs); test-data compression;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.885830
  • Filename
    4167987