Title :
Metalorganic Vapor Phase Epitaxial Growth of InAs/InGaAs Multiple Quantum Well Structures on InP Substrates
Author :
Sato, Tomonari ; Mitsuhara, Manabu ; Kakitsuka, Takaaki ; Fujisawa, Takeshi ; Kondo, Yasuhiro
Author_Institution :
Crystal Growth Res. Group, Nippon Telegraph & Telephone (NTT) Corp., Kanagawa
Abstract :
Device quality InAs/InGaAs multiple quantum well (MQW) structures were grown on InP substrates by metalorganic vapor phase epitaxy (MOVPE) and applied to lasers emitting at wavelengths longer than 2 mum. InAs/InGaAs MQWs with flat interfaces were obtained by adjusting the growth temperature between 460 degC and 510 degC. The photoluminescence peak wavelength of the MQWs increases from 1.93 to 2.47 mum as the thickness of InAs quantum wells increases from 2 to 7 nm. The structural and optical properties remained almost unchanged even after annealing at 620 degC. For 40-mu m-wide stripe broad-area lasers with 5-nm-thick InAs quantum wells, a lasing wavelength longer than 2.3 mum and an output power higher than 10 mW were achieved under continuous-wave operation at a temperature of 25 degC. These results indicate that InAs/InGaAs MQW structures grown by MOVPE are very useful for the active region of 2 mum wavelength lasers.
Keywords :
III-V semiconductors; MOCVD; annealing; gallium arsenide; indium compounds; photoluminescence; quantum well lasers; semiconductor growth; semiconductor quantum wells; vapour phase epitaxial growth; InAs-InGaAs; InP; MOVPE; active region; annealing; metalorganic vapor phase epitaxy; multiple quantum well; photoluminescence; size 2 nm; size 5 nm; size 7 nm; stripe broad-area lasers; temperature 25 degC; temperature 460 degC to 510 degC; temperature 620 degC; Annealing; Epitaxial growth; Epitaxial layers; Indium gallium arsenide; Indium phosphide; Photoluminescence; Quantum well devices; Quantum well lasers; Substrates; Temperature; InAs quantum well; metalorganic vapor phase epitaxy (MOVPE); mid-infrared lasers; quantum well lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2008.918106