• DocumentCode
    820558
  • Title

    Measurement of transient temperature during thermomagnetic writing in MO recording media

  • Author

    Shieh, Han-Ping D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    28
  • Issue
    5
  • fYear
    1992
  • fDate
    9/1/1992 12:00:00 AM
  • Firstpage
    2506
  • Lastpage
    2508
  • Abstract
    Real-time Kerr contrast images produced by a time-resolved microscope were used to derive transient temperature during thermomagnetic (TM) writing. Temperature profiles in magnetooptical films during TM writing were measured, and Curie diameter could be derived. With 5-ns and 0.3-μm temporal and spatial resolutions, one could determine transient temperature during both heating and cooling cycles in TM writing with adequate resolutions. Since thermal parameters such as heat conductivity K, and specific heat C of thin films are difficult to measure accurately, the numerical analyses tend to fit C, K, and others to match reasonable transient temperature profiles. With the developed techniques, a more reliable way to determine the outcome of a TM writing is thus feasible. Moreover, these methods, in conjunction with numerical methods, can be used to derive more realistic values of the thermal parameters of material in thin-film form
  • Keywords
    Kerr magneto-optical effect; magnetic thin films; magneto-optical recording; temperature distribution; temperature measurement; thermomagnetic recording; Curie diameter; cooling cycles; heat conductivity; heating cycle; magnetooptical recording media; real time Kerr contrast images; spatial resolutions; specific heat; temperature profiles; temporal resolution; thermomagnetic writing; transients temperature measurement; Conductivity measurement; Cooling; Heating; Microscopy; Numerical analysis; Spatial resolution; Temperature measurement; Thermal conductivity; Transistors; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.179538
  • Filename
    179538