• DocumentCode
    820585
  • Title

    Dynamic performance of a radial weak power system with multiple static VAr compensators

  • Author

    Ramos, A.J.P. ; Tyll, H.

  • Author_Institution
    Dept. de Movimento de Energia, Recife, Brazil
  • Volume
    4
  • Issue
    4
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    1316
  • Lastpage
    1325
  • Abstract
    The authors describe the dynamic performance of a radial weak, heavily shunt-compensated power system, with three static VAr (volt-ampere reactive) compensators (SVCs) of relatively large rating installed at short distances from one another. Dynamic interactions between the SVC control systems and between them and the network are analyzed by using eigenvalues and frequency-response techniques. Some noteworthy effects concerning the SVCs´ regulator stability that can arise in such systems are described. These effects, revealed in the eigenvalue analysis, were confirmed in TNA simulations. A brief description of the mathematical formulation and the complete system data is also included. Among other results, it is shown that the operation of SVCs with low values of ESCR can exhibit oscillation mode frequencies above 5 Hz, depending substantially on SVC regulator gain. In such cases, the representation of both network dynamics and thyristor time delay is crucial in the analysis if the SVC regulator stability limits
  • Keywords
    eigenvalues and eigenfunctions; frequency response; power systems; static VAr compensators; dynamic performance; eigenvalues; frequency-response techniques; multiple static VAr compensators; oscillation mode frequencies; radial weak power system; shunt-compensated power system; stability; thyristor time delay; Control systems; Eigenvalues and eigenfunctions; Frequency; Power system analysis computing; Power system dynamics; Power system stability; Power systems; Reactive power; Regulators; Static VAr compensators;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.41681
  • Filename
    41681