Title :
Simple analytical model for short-channel MOS devices
Author :
Chow, H.-C. ; Feng, W.-S. ; Kuo, J.B.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
6/1/1992 12:00:00 AM
Abstract :
A simple analytical model derived from a quasi-two-dimensional analysis with a non-vanishing E-field derivative at the pinchoff point and a continuous output conductance at the transition point for short-channel MOSFETs is presented. This model also covers mobility reduction, carrier velocity saturation, body, channel-length modulation, source-drain series resistance and short-channel effects for an accurate determination of the pinchoff point location without internal numerical iterations as compared to other models. This model can be used to describe the channel-length modulation effects more accurately in circuit simulation with short-channel MOSFETs
Keywords :
carrier mobility; insulated gate field effect transistors; semiconductor device models; MOS devices; analytical model; carrier velocity saturation; channel-length modulation; mobility reduction; pinchoff point location; quasi-two-dimensional analysis; short-channel MOSFETs; short-channel effects; source-drain series resistance;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G