• DocumentCode
    821045
  • Title

    The Effect of Gamma Irradiation on Optical Isolators

  • Author

    Soda, K.J. ; Barnes, C.E. ; Kiehl, R.A.

  • Author_Institution
    Air Force Weapons Laboratory Kirtland Air Force Base, New Mexico 87117
  • Volume
    22
  • Issue
    6
  • fYear
    1975
  • Firstpage
    2475
  • Lastpage
    2481
  • Abstract
    The effects of gamma radiation on optical isolators have been investigated. This study has included the simultaneous irradiation and measurement of the individual emitters and detectors making up the isolators. In this manner, the net effect of irradiation on the isolators could be attributed to the degradation of either the emitter or detector, or both. As expected, isolators containing photodiodes are more radiation resistant than those containing phototransistors. In the photodiode isolator the LED is responsible for essentially all the gamma-induced isolator degradation. The performance of phototransistor isolators depends strongly on the phototransistor bias, VCE, and the LED input current, ILED. At high ILED and low VCE where gamma-induced surface effects in the phototransistor are minimized, the degradation of the isolator is due primarily to the LED which is more sensitive than the LED in the photodiode isolator. In contrast, at low ILED and high VCE, gamma-induced surface damage in the phototransistor is the dominant effect and the isolator is quite sensitive to irradiation.
  • Keywords
    Circuit testing; Degradation; Detectors; Gallium arsenide; Isolators; Laboratories; Light emitting diodes; Optical sensors; Photodiodes; Phototransistors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4328153
  • Filename
    4328153