DocumentCode
821045
Title
The Effect of Gamma Irradiation on Optical Isolators
Author
Soda, K.J. ; Barnes, C.E. ; Kiehl, R.A.
Author_Institution
Air Force Weapons Laboratory Kirtland Air Force Base, New Mexico 87117
Volume
22
Issue
6
fYear
1975
Firstpage
2475
Lastpage
2481
Abstract
The effects of gamma radiation on optical isolators have been investigated. This study has included the simultaneous irradiation and measurement of the individual emitters and detectors making up the isolators. In this manner, the net effect of irradiation on the isolators could be attributed to the degradation of either the emitter or detector, or both. As expected, isolators containing photodiodes are more radiation resistant than those containing phototransistors. In the photodiode isolator the LED is responsible for essentially all the gamma-induced isolator degradation. The performance of phototransistor isolators depends strongly on the phototransistor bias, VCE, and the LED input current, ILED. At high ILED and low VCE where gamma-induced surface effects in the phototransistor are minimized, the degradation of the isolator is due primarily to the LED which is more sensitive than the LED in the photodiode isolator. In contrast, at low ILED and high VCE, gamma-induced surface damage in the phototransistor is the dominant effect and the isolator is quite sensitive to irradiation.
Keywords
Circuit testing; Degradation; Detectors; Gallium arsenide; Isolators; Laboratories; Light emitting diodes; Optical sensors; Photodiodes; Phototransistors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1975.4328153
Filename
4328153
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