EMP Susceptibility of Integrated Circuits

This paper summarizes the results of a major test program which involved the measurement of the pulse power failure thresholds of 41 integrated circuit types, representing seven logic families. The pulse widths used in these tests range from 0.1 microsecond to 10 microseconds. The failure threshold data have been grouped by logic family and test terminal to form failure categories. A simple failure model has been developed which is useful in predicting the failure thresholds of untested devices.