DocumentCode :
821161
Title :
Simultaneous Integral Measurement of Electron Energy and Charge Albedos
Author :
Lockwood, G.J. ; Miller, G.H. ; Halbleib, J.A.
Author_Institution :
Sandia Laboratories Albuquerque, New Mexico 87115
Volume :
22
Issue :
6
fYear :
1975
Firstpage :
2537
Lastpage :
2542
Abstract :
Electron energy and charge albedos were obtained for Be, Al, Ti, Mo, Ta, and U targets over the range of incident energies from 0.1 to 1.0 MeV. In the case of Al, Ta, and U the measurements were extended down to approximately 25 keV. Measurements were made for incident angles from 0° (normal) to 60°, and in some cases 75°, in 15° increments. The results agree well with existing experimental data and with Monte Carlo predictions, except at low energies where the discrepancies are only partially understood.
Keywords :
Backscatter; Charge measurement; Current measurement; Electrons; Energy measurement; Laboratories; Monte Carlo methods; Optical modulation; Packaging; Reflection;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1975.4328164
Filename :
4328164
Link To Document :
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