• DocumentCode
    821171
  • Title

    Measured propagation characteristics of coplanar waveguide on semi-insulating 4H-SiC through 800 K

  • Author

    Ponchak, George E. ; Alterovitz, Samuel A. ; Downey, Alan N. ; Freeman, Jon C. ; Schwartz, Zachary D.

  • Author_Institution
    NASA Glenn Res. Center, Cleveland, OH, USA
  • Volume
    13
  • Issue
    11
  • fYear
    2003
  • Firstpage
    463
  • Lastpage
    465
  • Abstract
    Wireless sensors for high temperature industrial applications and jet engines require RF transmission lines and RF integrated circuits (RFICs) on wide bandgap semiconductors such as SiC. In this paper, the complex propagation constant of coplanar waveguide fabricated on semi-insulating 4H-SiC has been measured through 813 K. It is shown that the attenuation increases 3.4 dB/cm at 50 GHz as the SiC temperature is increased from 300 K to 813 K. Above 500 K, the major contribution to loss is the decrease in SiC resistivity. The effective permittivity of the same line increases by approximately 5% at microwave frequencies and 20% at 1 GHz.
  • Keywords
    coplanar waveguides; electrical resistivity; high-temperature electronics; microwave measurement; permittivity; radiofrequency integrated circuits; silicon compounds; wide band gap semiconductors; 1 to 50 GHz; 3 to 8.75 muohmcm; 300 to 813 K; RF transmission lines; RFICs; SiC; SiC resistivity; SiC temperature; attenuation; complex propagation constant; coplanar waveguide; effective permittivity; high temperature industrial applications; jet engines; propagation characteristics; semi-insulating 4H-SiC; wide bandgap semiconductors; wireless sensors; Coplanar waveguides; Integrated circuit measurements; Radio frequency; Radiofrequency integrated circuits; Semiconductor waveguides; Sensor phenomena and characterization; Silicon carbide; Temperature sensors; Transmission line measurements; Wireless sensor networks;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2003.819373
  • Filename
    1243532