• DocumentCode
    821216
  • Title

    Uniform remanent state noise and its relation to microstructure [magnetic tapes]

  • Author

    Bissell, P.R. ; Araghi, M.S. ; Clarke, M.D. ; Chantrell, R.W.

  • Author_Institution
    Lancashire Polytech., Preston, UK
  • Volume
    28
  • Issue
    5
  • fYear
    1992
  • fDate
    9/1/1992 12:00:00 AM
  • Firstpage
    2692
  • Lastpage
    2694
  • Abstract
    DC noise measurements for particulate and metal evaporated thin-film tapes in which noise levels are recorded as a function of the remanent magnetization state are described. For particulate tapes, noise is seen to rise with magnetization, although these are deviations from a straight line relationship. For metal evaporated tapes, the noise is related to a recent theory and indicates a decrease in noise level with magnetization squared, except for small field applications after AC demagnetization
  • Keywords
    demagnetisation; magnetic properties of fine particles; magnetic tapes; magnetic thin films; noise; remanence; AC demagnetization; DC noise; Fe2O3:Co; metal evaporated thin-film tapes; noise levels; particulate tapes; remanent magnetization state; Magnetic field measurement; Magnetic heads; Magnetic noise; Microstructure; Noise generators; Noise level; Noise measurement; Remanence; Saturation magnetization; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.179599
  • Filename
    179599
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=821216