Radiation Damage to Integrated Injection Logic Cells

The effects of neutron and total dose gamma irradiations on the electrical characteristics of an integrated injection logic (I2L) cell and an I2L multiple inverter circuit were investigated. These units were designed and fabricated to obtain circuit development information and did not have radiation hardness as a goal. The following parameters of the test structures were measured as a function of total dose and neutron fluence: the dc common-base current gain of the lateral pnp transistor; the dc common-emitter current gain of the vertical npn transistor; the forward current-voltage characteristics of the injector-substrate junction, and the propagation delay versus power dissipation per gate for the multiple inverter circuit. The limitations of the present test structures in a radiation environment and possible hardening techniques are discussed.