• DocumentCode
    821266
  • Title

    Guest Editors´ Introduction: System IC Design Challenges beyond 32 nm

  • Author

    Joyner, William H., Jr. ; Yeh, David C.

  • Author_Institution
    Semiconductor Research Corp.
  • Volume
    25
  • Issue
    4
  • fYear
    2008
  • Firstpage
    294
  • Lastpage
    295
  • Abstract
    This special issue highlights ongoing research to address some of the challenges in the design of large ICs with dimensions well below 100 nm. The Gigascale Systems Research Center is organized around four themes and a design driver, and each is represented in this issue. There is also an exciting interview with Intel chair Craig Barrett. Accompanying the theme articles are three sidebars written by industry leaders (Richard Oehler of AMD, Ajith Amerasekera of Texas Instruments, and Leon Stok of IBM) on the challenges they see on the horizon, the paths being taken to address these challenges, and the role university programs can play. In addition, a Perspectives article by John Zolper discusses the value of this collaborative program to US national interests, including national security. Finally, there is a Last Byte column by the FCRP executive director Betsy Weitzman.
  • Keywords
    Buildings; Computer aided manufacturing; Concurrent computing; Design methodology; Lithography; Multicore processing; Power dissipation; Power system reliability; System performance; System-level design; 32 nm; Craig Barrett; Focus Center Research Program; Gigascale Systems Research Center; large ICs; multiuniversity research center;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.95
  • Filename
    4584450