Title :
Challenges and Solutions for Late- and Post-Silicon Design
Author :
Rabaey, Jan M. ; Malik, Sharad
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA
Abstract :
As technology scaling becomes more difficult, continuing advances in electronic products and their underlying ICs increasingly rely on innovative design solutions. This article outlines some of the complexity, reliability, and productivity challenges and how the Gigascale Systems Research Center is addressing them.
Keywords :
electronic products; innovation management; integrated circuit design; monolithic integrated circuits; productivity; semiconductor device reliability; electronic products; innovative design; integrated circuits; late-silicon design; post-silicon design; productivity; reliability; CMOS technology; Computer industry; Cost function; Design methodology; Fellows; Humans; Integrated circuit interconnections; Moore´s Law; Nanoscale devices; Productivity; Moore´s law; design technology; post-silicon; roadmap; scaling; system-level design.;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.91
