Title :
Electrical and Radiation Characteristics of MOS/SOS Linear Devices
Author :
Nielsen, R.L. ; Butcher, D.T. ; Ronen, R.S.
Author_Institution :
Rockwell International, Electronics Research Division 3370 Miraloma Avenue, Anaheim, California 92803
Keywords :
Analog integrated circuits; Application specific integrated circuits; Digital integrated circuits; Digital systems; Integrated circuit packaging; Integrated circuit reliability; Large scale integration; MOS devices; MOSFETs; Power system reliability;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4328180
