Title :
Radiation Effects in Charge Coupled Devices
Author :
Williams, Ross A. ; Nelson, Richard D.
Author_Institution :
Rockwell International Corporation Electronics Research Division 3370 Miraloma Avenue, Anaheim, California
Keywords :
Charge coupled devices; Charge-coupled image sensors; Electrodes; Ionizing radiation; MOS capacitors; Neutrons; Potential well; Radiation effects; Silicon; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1975.4328182
