DocumentCode :
821355
Title :
Variability and New Design Paradigms
Author :
Stok, Leon
Author_Institution :
IBM
Volume :
25
Issue :
4
fYear :
2008
Firstpage :
344
Lastpage :
344
Abstract :
In the late- and post-silicon eras, variation of all nanometer processes will continue to increase significantly. The industry is gradually addressing this situation and exposing more variability information to the designer. According to the Gigascale Systems Research Center, the deterministic era will be over for most on-chip applications and alternatives must be found. The author of this sidebar looks forward to the time when the two will meet: when more revolutionary design techniques will find their way into practical designs, and when one of the computational paradigms will suddenly be needed to cope with an unexpected surge in variability or reliability in a particular design or technology.
Keywords :
Character generation; Circuit noise; Computational modeling; Information analysis; Power system modeling; Robustness; Semiconductor device noise; Statistical analysis; System-on-a-chip; Timing; Gigascale Systems Research Center; computational paradigms; deterministic era; on-chip applications; reliability; variability;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.115
Filename :
4584459
Link To Document :
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