DocumentCode
821355
Title
Variability and New Design Paradigms
Author
Stok, Leon
Author_Institution
IBM
Volume
25
Issue
4
fYear
2008
Firstpage
344
Lastpage
344
Abstract
In the late- and post-silicon eras, variation of all nanometer processes will continue to increase significantly. The industry is gradually addressing this situation and exposing more variability information to the designer. According to the Gigascale Systems Research Center, the deterministic era will be over for most on-chip applications and alternatives must be found. The author of this sidebar looks forward to the time when the two will meet: when more revolutionary design techniques will find their way into practical designs, and when one of the computational paradigms will suddenly be needed to cope with an unexpected surge in variability or reliability in a particular design or technology.
Keywords
Character generation; Circuit noise; Computational modeling; Information analysis; Power system modeling; Robustness; Semiconductor device noise; Statistical analysis; System-on-a-chip; Timing; Gigascale Systems Research Center; computational paradigms; deterministic era; on-chip applications; reliability; variability;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.115
Filename
4584459
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