• DocumentCode
    821355
  • Title

    Variability and New Design Paradigms

  • Author

    Stok, Leon

  • Author_Institution
    IBM
  • Volume
    25
  • Issue
    4
  • fYear
    2008
  • Firstpage
    344
  • Lastpage
    344
  • Abstract
    In the late- and post-silicon eras, variation of all nanometer processes will continue to increase significantly. The industry is gradually addressing this situation and exposing more variability information to the designer. According to the Gigascale Systems Research Center, the deterministic era will be over for most on-chip applications and alternatives must be found. The author of this sidebar looks forward to the time when the two will meet: when more revolutionary design techniques will find their way into practical designs, and when one of the computational paradigms will suddenly be needed to cope with an unexpected surge in variability or reliability in a particular design or technology.
  • Keywords
    Character generation; Circuit noise; Computational modeling; Information analysis; Power system modeling; Robustness; Semiconductor device noise; Statistical analysis; System-on-a-chip; Timing; Gigascale Systems Research Center; computational paradigms; deterministic era; on-chip applications; reliability; variability;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.115
  • Filename
    4584459