• DocumentCode
    821420
  • Title

    With pick and shovel through our data

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsystems
  • Volume
    25
  • Issue
    4
  • fYear
    2008
  • Firstpage
    382
  • Lastpage
    383
  • Abstract
    This is a review of Data Mining: Concepts, Models, Methods, and Algorithms (by Mehmed Kantardzic). Data mining is used to learn the characteristics of a population on the basis of a set of samples. One application of this in fabs is statistical postprocessing. As chips get bigger, test data volumes grow as well. It might be possible to mine this data to discover more about these chips and the processes to build them. This book is written at the right level for test engineers, and it doesn´t include overly complex mathematical treatments of the concepts. Those in test can glean some good ideas here on how to apply data mining to get the most from their piles of test data, and on some of the tools that could help them.
  • Keywords
    Books; Clustering methods; Data mining; Databases; Learning systems; Logic testing; Search engines; Sections; Sun; Unsupervised learning; data mining; fuzzy logic; test data volumes; test engineers; tools;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.122
  • Filename
    4584467