DocumentCode
821420
Title
With pick and shovel through our data
Author
Davidson, Scott
Author_Institution
Sun Microsystems
Volume
25
Issue
4
fYear
2008
Firstpage
382
Lastpage
383
Abstract
This is a review of Data Mining: Concepts, Models, Methods, and Algorithms (by Mehmed Kantardzic). Data mining is used to learn the characteristics of a population on the basis of a set of samples. One application of this in fabs is statistical postprocessing. As chips get bigger, test data volumes grow as well. It might be possible to mine this data to discover more about these chips and the processes to build them. This book is written at the right level for test engineers, and it doesn´t include overly complex mathematical treatments of the concepts. Those in test can glean some good ideas here on how to apply data mining to get the most from their piles of test data, and on some of the tools that could help them.
Keywords
Books; Clustering methods; Data mining; Databases; Learning systems; Logic testing; Search engines; Sections; Sun; Unsupervised learning; data mining; fuzzy logic; test data volumes; test engineers; tools;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.122
Filename
4584467
Link To Document