DocumentCode :
821420
Title :
With pick and shovel through our data
Author :
Davidson, Scott
Author_Institution :
Sun Microsystems
Volume :
25
Issue :
4
fYear :
2008
Firstpage :
382
Lastpage :
383
Abstract :
This is a review of Data Mining: Concepts, Models, Methods, and Algorithms (by Mehmed Kantardzic). Data mining is used to learn the characteristics of a population on the basis of a set of samples. One application of this in fabs is statistical postprocessing. As chips get bigger, test data volumes grow as well. It might be possible to mine this data to discover more about these chips and the processes to build them. This book is written at the right level for test engineers, and it doesn´t include overly complex mathematical treatments of the concepts. Those in test can glean some good ideas here on how to apply data mining to get the most from their piles of test data, and on some of the tools that could help them.
Keywords :
Books; Clustering methods; Data mining; Databases; Learning systems; Logic testing; Search engines; Sections; Sun; Unsupervised learning; data mining; fuzzy logic; test data volumes; test engineers; tools;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.122
Filename :
4584467
Link To Document :
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