• DocumentCode
    821697
  • Title

    Minimization of threshold current in short wavelength AlGaInP vertical-cavity surface-emitting lasers

  • Author

    Chow, Weng W. ; Crawford, Mary Hagerott ; Schneider, Richard P.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    1
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    649
  • Lastpage
    653
  • Abstract
    This paper investigates the interdependence of wavelength and threshold current in an AlGaInP vertical-cavity surface-emitting laser with an emphasis on optimizing the performance of shorter wavelength lasers. We apply a model which includes bandstructure, band-filling and many body effects in a consistent manner, as well as leakage current effects, to evaluate the effect of strain and quantum confinement on threshold current. We find that leakage current becomes increasingly important for shorter wavelength devices, comprising more than half of the total current for a laser emitting at 620 nm. The reduction of threshold current with increasing compressive strain is clearly demonstrated and the dependence of threshold current density on quantum well width is found to be greater for shorter wavelength lasers
  • Keywords
    III-V semiconductors; aluminium compounds; current density; gallium compounds; indium compounds; laser beams; laser cavity resonators; quantum well lasers; surface emitting lasers; 620 nm; AlGaInP; band-filling; bandstructure; compressive strain; leakage current effects; many body effects; quantum confinement effect; quantum well width; shorter wavelength lasers; strain effect; threshold current; vertical-cavity surface-emitting lasers; Capacitive sensors; Laser modes; Laser theory; Leakage current; Optical surface waves; Quantum well lasers; Surface emitting lasers; Surface waves; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.401253
  • Filename
    401253