DocumentCode
821798
Title
Thermally Stimulated Current Measurement of Traps in Detector-Grade CdTe
Author
Barnes, C.E. ; Zanio, K.
Author_Institution
Sandia Laboratories Albuquerque, New Mexico 87115
Volume
23
Issue
1
fYear
1976
Firstpage
177
Lastpage
181
Abstract
Thermally stimulated current (TSC) has been measured in ¿ detector-grade, high resistivity CdTe:In and CdTe:In,Cl. Electron mobility-trapping time products, ¿¿+, measured at room temperature correlate strongly with the shape and magnitude of a prominent TSC band observed at 40 K. This correlation is used as the basis for a simple method of selecting samples appropriate for detector applications.
Keywords
Conductivity; Current measurement; Detectors; Electron mobility; Electron traps; Laboratories; Radiative recombination; Shape measurement; Spontaneous emission; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1976.4328233
Filename
4328233
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