Title :
Conformance testing of VMEbus and Multibus II products
Author :
Adams, Marcus ; Qian, Yi ; Tomaszunas, Jacek ; Burtscheidt, Josef ; Kaiser, Edgar ; Juhasz, Csaba
Author_Institution :
Comput. Res. Center, Karlsruhe, Germany
Abstract :
A system for testing VMEbus and Multibus II products is described. The system is mainly automated to reduce costs and ensure impartiality. A test campaign is explained in the sense of a walk through the test system, in the way of a customer-such as a manufacturer, reseller, or original equipment manufacturer-would see it. The focus is on testing bus interfaces because it is more complex than testing backplanes.<>
Keywords :
computer interfaces; electronic equipment testing; standards; Multibus II; VMEbus; bus interfaces; testing; Automatic testing; Backplanes; Control systems; Electronic equipment testing; Information analysis; Logic devices; Logic testing; Pattern analysis; Programmable logic arrays; System testing;
Journal_Title :
Micro, IEEE
