• DocumentCode
    821965
  • Title

    Error correction for diffraction and multiple scattering in free-space microwave measurement of materials

  • Author

    Hock, Kai Meng

  • Author_Institution
    Temasek Labs., Nat. Univ. of Singapore, Singapore
  • Volume
    54
  • Issue
    2
  • fYear
    2006
  • Firstpage
    648
  • Lastpage
    659
  • Abstract
    Metamaterials often have sharp resonances in permittivity or permeability at microwave frequencies. The sizes of the inclusions are of the order of millimeters, and this means that it is more convenient to carry out the measurement in free space. Time gating is often used in the free-space method to remove multiple scattering from the antennas and the surrounding objects. However, this lowers the resolution in the frequency domain, making it difficult to resolve the resonances reliably. Diffraction around the sample could also reduce measurement accuracy. A calibration procedure, based on the 16-term error model, which removes the need for time gating by correcting for both multiple scattering and diffraction, is developed. This procedure is tested on carbonyl iron composite and split-ring resonators, and the results are presented.
  • Keywords
    calibration; electromagnetic wave diffraction; electromagnetic wave scattering; error correction; magnetic permeability measurement; metamaterials; microwave materials; microwave measurement; permittivity measurement; strip line resonators; calibration procedure; diffraction scattering; error correction; free-space microwave measurement; materials measurement; metamaterials; multiple scattering; split-ring resonators; time gating; Antenna measurements; Diffraction; Error correction; Metamaterials; Microwave frequencies; Microwave measurements; Permeability; Permittivity measurement; Resonance; Scattering; Error correction; free-space measurement; metamaterials; microwave; split-ring resonators (SRRs);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.862666
  • Filename
    1589489