Title :
Limit on the Addressability of Fault-Tolerant Nanowire Decoders
Author :
Chee, Yeow Meng ; Ling, Alan C H
Author_Institution :
Nanyang Technol. Univ., Singapore
Abstract :
Although prone to fabrication error, the nanowire crossbar is a promising candidate compoent for next generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires N(m,e) that can be addressed by m mesowires, in the face of up to e fabrication errors. Asymptotically tight bounds on N(m,e) are established in this paper. In particular, it is shown that N(m,e) = Theta(2m / mepsiv+1/2). Interesting observations are made on the equivalence between this problem and the problem of constructing optimal EC/AUED codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUEC codes literature.
Keywords :
decoding; fault tolerance; nanowires; asymptotically tight bounds; diffbounded set systems; fabrication errors; fault-tolerant nanowire decoders; mesowires; nanowire crossbar architecture; next generation nanometer-scale circuits; optimal EC/AUED codes; pooling designs; superimposed distance codes; Assembly; CMOS technology; Circuits; Computer architecture; Conductivity; Decoding; Fabrication; Fault tolerance; Lithography; Moore´s Law; Switches; Wires; Control Structure Reliability; General; Systems and Information Theory; Testing; and Fault-Tolerance;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2008.130