• DocumentCode
    822100
  • Title

    Limit on the Addressability of Fault-Tolerant Nanowire Decoders

  • Author

    Chee, Yeow Meng ; Ling, Alan C H

  • Author_Institution
    Nanyang Technol. Univ., Singapore
  • Volume
    58
  • Issue
    1
  • fYear
    2009
  • Firstpage
    60
  • Lastpage
    68
  • Abstract
    Although prone to fabrication error, the nanowire crossbar is a promising candidate compoent for next generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires N(m,e) that can be addressed by m mesowires, in the face of up to e fabrication errors. Asymptotically tight bounds on N(m,e) are established in this paper. In particular, it is shown that N(m,e) = Theta(2m / mepsiv+1/2). Interesting observations are made on the equivalence between this problem and the problem of constructing optimal EC/AUED codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUEC codes literature.
  • Keywords
    decoding; fault tolerance; nanowires; asymptotically tight bounds; diffbounded set systems; fabrication errors; fault-tolerant nanowire decoders; mesowires; nanowire crossbar architecture; next generation nanometer-scale circuits; optimal EC/AUED codes; pooling designs; superimposed distance codes; Assembly; CMOS technology; Circuits; Computer architecture; Conductivity; Decoding; Fabrication; Fault tolerance; Lithography; Moore´s Law; Switches; Wires; Control Structure Reliability; General; Systems and Information Theory; Testing; and Fault-Tolerance;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2008.130
  • Filename
    4585368