• DocumentCode
    822220
  • Title

    Determination of the structural anisotropy in amorphous Tb-Fe films

  • Author

    Harris, V.G. ; Aylesworth, K.D. ; Das, B.N. ; Elam, W.T. ; Koon, N.C.

  • Author_Institution
    US Naval Res. Lab., Washington, DC, USA
  • Volume
    28
  • Issue
    5
  • fYear
    1992
  • fDate
    9/1/1992 12:00:00 AM
  • Firstpage
    2958
  • Lastpage
    2963
  • Abstract
    The authors report the measurement and description of an anisotropy between the in-plane and out-of-plane atomic structure in as-deposited amorphous Tb-Fe alloy films. This anisotropy, measured using a conversion-electron extended X-ray absorption fine structure (EXAFS) technique, correlates closely with measured values of the perpendicular magnetic anisotropy energy as a function of both film composition and annealing temperature. Modeling of the EXAFS data using theoretical codes and structural standards suggests that the Tb-Tb and Fe-Fe pair correlations are greater parallel to the film plane and that the Tb-Fe pair correlations are greater perpendicular to the film plane. Upon annealing at 300°C the structural anisotropy is eliminated, and the magnetic anisotropy is lowered to a level consistent with magnetoelastic interactions between the film and substrate
  • Keywords
    EXAFS; annealing; ferrimagnetic properties of substances; iron alloys; magnetic anisotropy; magnetic thin films; noncrystalline state structure; sputtered coatings; terbium alloys; EXAFS; Tb-Fe films; amorphous film; annealing; annealing temperature; conversion-electron extended X-ray absorption fine structure; film composition; ion beam sputtering; magnetic anisotropy; magnetic films; magnetoelastic interactions; pair correlations; structural anisotropy; Amorphous materials; Anisotropic magnetoresistance; Annealing; Atomic measurements; Electromagnetic wave absorption; Energy measurement; Magnetic anisotropy; Magnetic films; Perpendicular magnetic anisotropy; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.179685
  • Filename
    179685