DocumentCode
82266
Title
Two-Dimensional Error-Pattern-Correcting Codes
Author
Sung Whan Yoon ; Jaekyun Moon
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume
63
Issue
8
fYear
2015
fDate
Aug. 2015
Firstpage
2725
Lastpage
2740
Abstract
Two-dimensional (2D) cyclic codes are presented which correct any single occurrence of known 2D error patterns within a 2D array of bits. Applications for this type of codes include storage and display devices. The code construction begins with a generation of distinct syndrome sets for all targeted 2D error patterns. A method to refine the syndrome sets is then presented for making each syndrome set to contain distinct members, thereby guaranteeing full correction capability for the given list of known error patterns. Using an example construction, the effectiveness of the proposed coding approach is demonstrated versus the maximum-distance-separable (MDS) random-error-correcting code and known 2D burst-correcting codes for a 2D intersymbol interference (ISI) channel that yields a few dominant, but relatively large error patterns.
Keywords
cyclic codes; error correction codes; intersymbol interference; random codes; 2D array; 2D burst-correcting codes; 2D cyclic codes; 2D error patterns; 2D error-pattern-correcting codes; 2D intersymbol interference; ISI channel; MDS random-error-correcting code; code construction; maximum-distance-separable random-error-correcting code; syndrome sets; Arrays; Encoding; Parity check codes; Polynomials; Registers; Shape; Silicon; Error correction codes; intersymbol interference; magnetic memory; multidimensional signal processing;
fLanguage
English
Journal_Title
Communications, IEEE Transactions on
Publisher
ieee
ISSN
0090-6778
Type
jour
DOI
10.1109/TCOMM.2015.2438869
Filename
7115093
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