• DocumentCode
    82266
  • Title

    Two-Dimensional Error-Pattern-Correcting Codes

  • Author

    Sung Whan Yoon ; Jaekyun Moon

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    63
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2725
  • Lastpage
    2740
  • Abstract
    Two-dimensional (2D) cyclic codes are presented which correct any single occurrence of known 2D error patterns within a 2D array of bits. Applications for this type of codes include storage and display devices. The code construction begins with a generation of distinct syndrome sets for all targeted 2D error patterns. A method to refine the syndrome sets is then presented for making each syndrome set to contain distinct members, thereby guaranteeing full correction capability for the given list of known error patterns. Using an example construction, the effectiveness of the proposed coding approach is demonstrated versus the maximum-distance-separable (MDS) random-error-correcting code and known 2D burst-correcting codes for a 2D intersymbol interference (ISI) channel that yields a few dominant, but relatively large error patterns.
  • Keywords
    cyclic codes; error correction codes; intersymbol interference; random codes; 2D array; 2D burst-correcting codes; 2D cyclic codes; 2D error patterns; 2D error-pattern-correcting codes; 2D intersymbol interference; ISI channel; MDS random-error-correcting code; code construction; maximum-distance-separable random-error-correcting code; syndrome sets; Arrays; Encoding; Parity check codes; Polynomials; Registers; Shape; Silicon; Error correction codes; intersymbol interference; magnetic memory; multidimensional signal processing;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/TCOMM.2015.2438869
  • Filename
    7115093