Title :
Guest editors´ introduction: defect-oriented testing in the deep-submicron era
Author :
Segura, J. ; Maxwell, P.
Author_Institution :
Agilent Technologies
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Circuit noise; Circuit testing; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit noise; Noise generators; Noise level; Signal to noise ratio; Voltage;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1033786
