• DocumentCode
    822729
  • Title

    Guest editors´ introduction: defect-oriented testing in the deep-submicron era

  • Author

    Segura, J. ; Maxwell, P.

  • Author_Institution
    Agilent Technologies
  • Volume
    19
  • Issue
    5
  • fYear
    2002
  • Firstpage
    5
  • Lastpage
    7
  • Abstract
    Presents the guest editorial for this issue of the publication.
  • Keywords
    Circuit noise; Circuit testing; Coupling circuits; Crosstalk; Integrated circuit interconnections; Integrated circuit noise; Noise generators; Noise level; Signal to noise ratio; Voltage;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1033786
  • Filename
    1033786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=822729