• DocumentCode
    822750
  • Title

    Resistance characterization for weak open defects

  • Author

    Montañés, Rosa Rodríguez ; De Gyvez, José Pineda ; Volf, Paul

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • Volume
    19
  • Issue
    5
  • fYear
    2002
  • Firstpage
    18
  • Lastpage
    26
  • Abstract
    Strong open defects can cause a circuit to malfunction, but even weak open defects can cause it to function poorly. Detecting weak opens is thus an important, but challenging, task. Characterizing weak opens can help researchers assess the need for delay fault tests
  • Keywords
    fault diagnosis; integrated circuit testing; delay fault tests; delay faults; inductive fault analysis; malfunctioning circuits; open defects; Circuit faults; Circuit testing; Clouds; Delay; Monitoring; Routing; Semiconductor device testing; Shape; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1033788
  • Filename
    1033788
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=822750