DocumentCode :
822832
Title :
Neighborhood selection for IDDQ outlier screening at wafer sort
Author :
Daasch, W. Robert ; McNames, James ; Madge, Robert ; Cota, Kevin
Author_Institution :
Integrated Circuits Design & Test Lab., Portland State Univ., OR, USA
Volume :
19
Issue :
5
fYear :
2002
Firstpage :
74
Lastpage :
81
Abstract :
To screen defective dies, IDDQ tests require a reliable estimate of each die´s defect-free measurement. The nearest-neighbor residual (NNR) method provides a straightforward, data-driven estimate of test measurements for improved identification of die outliers
Keywords :
automatic test equipment; integrated circuit testing; wafer-scale integration; NNR; die outliers; identification; nearest-neighbor residual method; statistical post-processing; test measurements; wafer sort; Application software; Large scale integration; Logic design; Logic testing; Manufacturing; Probability distribution; Production; Statistical analysis; Statistical distributions;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2002.1033795
Filename :
1033795
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=822832
بازگشت