Deconvolution of magnetic force images by Fourier analysis

Author

Chang, Thomas ; Lagerquist, Mark ; Zhu, Jian-Gang ; Judy, Jack H. ; Fischer, P.B. ; Chou, S.Y.

Author_Institution

Minnesota Univ., Minneapolis, MN, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

3138

Lastpage

3140

Abstract

A novel technique which allows the true magnetic charge distribution of a sample to be obtained from a raw MFM image by deconvolution is presented. The formation of magnetic force microscopy (MFM) images can be considered as a convolution of the tip response function and the divergence of the sample magnetization. The key element in this method is the tip response function, which contains the information about the magnetic and geometric properties of the tip. This tip response function is obtained by imaging the flux emanating from the end of an ultranarrow single-domain nickel strip which approximates a point magnetic charge. An MFM image of recorded bits obtained with the same tip is deconvolved utilizing Fourier transformation methods. By this approach, the deconvolved image becomes tip independent and it is possible to achieve spatial resolutions as small as the width of the Ni strip, which can be 10 nm wide

Keywords

Fourier transforms; image processing; magnetic field measurement; magnetic force microscopy; Fourier analysis; Fourier transformation methods; MFM image; deconvolution; deconvolved image; magnetic charge distribution; magnetic force images; magnetic force microscopy; point magnetic charge; sample magnetization; spatial resolutions; surface magnetic fields; tip response function; ultranarrow single domain Ni strip; Convolution; Deconvolution; Image analysis; Magnetic analysis; Magnetic flux; Magnetic force microscopy; Magnetic forces; Magnetization; Nickel; Strips;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179737

Filename

179737