Title :
Multilevel testability analysis and solutions for integrated Bluetooth transceivers
Author :
Ozev, Sule ; Orailoglu, Alex ; Olgaard, Christian V.
Author_Institution :
Comput. Eng. Dept., Univ. of California, San Diego, CA, USA
Abstract :
As use of wireless communications rises and profit margins shrink, low-cost solutions are becoming increasingly important. Incorporating test design and DFT into the system design flow is essential to achieving such solutions. This case study analyzes test requirements, implications, and test cost for low-cost Bluetooth systems, which enable communication among several electronic components
Keywords :
design for testability; radio access networks; telecommunication equipment testing; Bluetooth systems; DFT; RF specifications; RF transceiver; design optimizations; system design flow; test design; wireless communications; Bit error rate; Bluetooth; Circuit testing; Costs; Design for testability; Electronic equipment testing; Frequency conversion; Noise measurement; System testing; Transceivers;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1033796
