Title :
First Observation of Flux Avalanches in a-MoSi Superconducting Thin Films
Author :
Colauto, F. ; Motta, M. ; Palau, A. ; Blamire, M.G. ; Johansen, T.H. ; Ortiz, W.A.
Author_Institution :
Dept. de Fis., Univ. Fed. de Sao Carlos, Sao Carlos, Brazil
Abstract :
We have observed the occurrence of dendritic flux avalanches in an amorphous film of Mo84Si16. These events are understood to have a thermomagnetic origin and involve the abrupt penetration of bursts of magnetic flux taking place within a limited window of temperatures and magnetic fields. While dc-magnetometry allows one to determine the threshold fields for the occurrence of the thermomagnetic instabilities, magneto-optical imaging reveals the spatial distribution of magnetic flux throughout the sample. Conducting appropriate experiments, typical for this goal, avalanches were confirmed to be a characteristic of this material, ruling out the otherwise admissible possibility of an experimental artifact or a feature related to defects in the film. After the present observation, amorphous MoSi alloys, or a-MoSi, can be included in the gallery of superconducting materials exhibiting flux avalanches when in the form of thin films, a characteristic that must be carefully taken into consideration when one plans to employ films of those materials in applications.
Keywords :
amorphous state; magnetic flux; magneto-optical effects; molybdenum compounds; superconducting thin films; thermomagnetic effects; MoSi; a-MoSi superconducting thin films; amorphous film; dc magnetometry; dendritic flux avalanches; magnetic flux; magneto-optical imaging; spatial distribution; superconducting materials; thermomagnetic instability; Amorphous magnetic materials; Art; High-temperature superconductors; Magnetic flux; Magnetic resonance imaging; Superconducting magnets; Temperature measurement; Amorphous MoSi; Flux avalanches; Flux jumps; Instabilities; Superconducting thin films; flux avalanches; flux jumps; instabilities; superconducting thin films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2376183