DocumentCode :
82305
Title :
Pumping Effect Measured by PIV Method in a Multilayer Spike Electrode EHD Device for Air Cleaning
Author :
Podlinski, J. ; Niewulis, Anna ; Berendt, A. ; Mizeraczyk, J.
Author_Institution :
Centre for Plasma & Laser Eng., Szewalski Inst. of Fluid-Flow Machinery, Gdańsk, Poland
Volume :
49
Issue :
6
fYear :
2013
fDate :
Nov.-Dec. 2013
Firstpage :
2402
Lastpage :
2408
Abstract :
Dust particles can be harmful for human health when inhaled. Particularly dangerous are submicrometer dust particles, which can contain traces of toxic elements and can easily penetrate into the human respiratory system. Thus, efficient devices for the air cleaning from submicrometer dust particles are needed. Recently, Katatani and Mizuno have proposed an electrohydrodynamic (EHD) device for air cleaning for submicrometer particles. In this paper, we present the flow velocity field patterns in an EHD device for air cleaning, which is similar to that of Katatani and Mizuno. The presented EHD device had a set of the stressed plate electrodes with spike tips and the grounded electrodes also in the form of plates. The parametric studies of the flow velocity patterns in such an EHD device using particle image velocimetry were made by us for a different electrode arrangement.
Keywords :
air cleaners; dust; electrohydrodynamics; electrostatic precipitators; flow measurement; respiratory protection; velocimeters; PIV method; air cleaning; electrode arrangement; electrohydrodynamic device; flow velocity patterns; fluid flow measurement; human respiratory system; multilayer spike electrode EHD device; multilayer spike electrode electrostatic precipitator; particle image velocimetry; pumping effect measurement; spike tips; stressed plate electrodes; submicrometer dust particles; toxic elements; Atmospheric measurements; Discharges (electric); Ducts; Electrodes; Fluid flow measurement; Particle measurements; Voltage measurement; EHD pump; Electrohydrodynamic (EHD); electrostatic precipitator (ESP); flow patterns; fluid flow measurement; particle image velocimetry (PIV);
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2013.2265214
Filename :
6522181
Link To Document :
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