Oriented barium hexaferrite thin films prepared by pulsed laser deposition

Author

Dorsey, P. ; Seed, R. ; Vittoria, C. ; Chrisey, D.B. ; Carosella, C. ; Lubitz, P. ; Horwitz, J.S.

Author_Institution

Northeastern Univ., Boston, MA, USA

Volume

28

Issue

5

fYear

1992

fDate

9/1/1992 12:00:00 AM

Firstpage

3216

Lastpage

3218

Abstract

Oriented thin films of barium hexaferrite, BaFe₁₂O₁₉, were grown in situ on (0001) sapphire substrates utilizing a pulsed laser deposition technique. X-ray diffraction, elastic backscattering spectrometry, ferrimagnetic resonance, and vibrating sample magnetometry confirm that the structure, composition, and magnetic parameters are consistent with films prepared by other techniques such as liquid phase epitaxy

Keywords

Rutherford backscattering; X-ray diffraction examination of materials; barium compounds; ferrimagnetic properties of substances; ferrimagnetic resonance; ferrites; magnetic epitaxial layers; magnetic field measurement; magnetic thin films; pulsed laser deposition; (0001) sapphire substrates; Al₂O₃ substrates; BaFe₁₂O₁₉; X-ray diffraction; elastic backscattering spectrometry; ferrimagnetic resonance; liquid phase epitaxy; oriented thin films; pulsed laser deposition; vibrating sample magnetometry; Barium; Ferrimagnetic films; Magnetic resonance; Magnetoelasticity; Optical pulses; Pulsed laser deposition; Sputtering; Substrates; Transistors; X-ray lasers;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.179763

Filename

179763