DocumentCode
823289
Title
Magnetic property and microstructure dependence of CoCrTa/Cr media on substrate temperature and bias
Author
Duan, Shanlin ; Khan, Mahbub R. ; Haefele, Joseph E. ; Tang, Li ; Thomas, Gareth
Author_Institution
Seagate Magnetics, Fremont, CA, USA
Volume
28
Issue
5
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
3258
Lastpage
3260
Abstract
Thin CoCrTa/Cr films were deposited at different substrate temperature T s and substrate biasing voltage V b. The in-plane coercivity increased significantly with T S and V b. Coercive squareness and orientation ratio also increased with T s and V b. Transmission electron microscopy (TEM) results indicated that, at low T s, the magnetic film had an isolated-grain structure, with smaller sub-grain structure within each grain. At high T s, the magnetic film had a closely packed grain structure, probably due to the enhanced adatom mobility; the grain size was much larger and striations were observed in many grains. The application of a negative biasing voltage to the substrate also tended to reduce the grain isolation. At high T s, it seems that biasing also reduced the number of grains with striations. Scanning electron microscopy (SEM) results indicated that, with increasing T s and V b, more high-frequency texture line appeared in the magnetic layer, which was likely related to the increase of orientation ratio and squareness with increasing T s and V b
Keywords
chromium; chromium alloys; cobalt alloys; coercive force; crystal microstructure; ferromagnetic properties of substances; magnetic recording; magnetic thin films; metallic thin films; scanning electron microscope examination of materials; sputter deposition; sputtered coatings; tantalum alloys; transmission electron microscope examination of materials; CoCrTa alloys; CoCrTa-Cr; Cr; SEM; TEM; bias; coercive orientation; coercive squareness; grain isolation; grain size; grain structure; in-plane coercivity; longitudinal thin film media; microstructure; scanning electron microscopy; substrate biasing voltage; substrate temperature; transmission electron microscopy; Chromium; Magnetic films; Magnetic force microscopy; Magnetic properties; Microstructure; Scanning electron microscopy; Substrates; Temperature; Transmission electron microscopy; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.179776
Filename
179776
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