• DocumentCode
    823289
  • Title

    Magnetic property and microstructure dependence of CoCrTa/Cr media on substrate temperature and bias

  • Author

    Duan, Shanlin ; Khan, Mahbub R. ; Haefele, Joseph E. ; Tang, Li ; Thomas, Gareth

  • Author_Institution
    Seagate Magnetics, Fremont, CA, USA
  • Volume
    28
  • Issue
    5
  • fYear
    1992
  • fDate
    9/1/1992 12:00:00 AM
  • Firstpage
    3258
  • Lastpage
    3260
  • Abstract
    Thin CoCrTa/Cr films were deposited at different substrate temperature Ts and substrate biasing voltage V b. The in-plane coercivity increased significantly with TS and Vb. Coercive squareness and orientation ratio also increased with Ts and Vb. Transmission electron microscopy (TEM) results indicated that, at low Ts, the magnetic film had an isolated-grain structure, with smaller sub-grain structure within each grain. At high Ts, the magnetic film had a closely packed grain structure, probably due to the enhanced adatom mobility; the grain size was much larger and striations were observed in many grains. The application of a negative biasing voltage to the substrate also tended to reduce the grain isolation. At high Ts, it seems that biasing also reduced the number of grains with striations. Scanning electron microscopy (SEM) results indicated that, with increasing Ts and V b, more high-frequency texture line appeared in the magnetic layer, which was likely related to the increase of orientation ratio and squareness with increasing Ts and Vb
  • Keywords
    chromium; chromium alloys; cobalt alloys; coercive force; crystal microstructure; ferromagnetic properties of substances; magnetic recording; magnetic thin films; metallic thin films; scanning electron microscope examination of materials; sputter deposition; sputtered coatings; tantalum alloys; transmission electron microscope examination of materials; CoCrTa alloys; CoCrTa-Cr; Cr; SEM; TEM; bias; coercive orientation; coercive squareness; grain isolation; grain size; grain structure; in-plane coercivity; longitudinal thin film media; microstructure; scanning electron microscopy; substrate biasing voltage; substrate temperature; transmission electron microscopy; Chromium; Magnetic films; Magnetic force microscopy; Magnetic properties; Microstructure; Scanning electron microscopy; Substrates; Temperature; Transmission electron microscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.179776
  • Filename
    179776