DocumentCode :
823341
Title :
VUV-Spectroscopy of Multiply Charged Ion Source-Plasmas
Author :
Bruck, M. ; Bruckmuller, R. ; Hertenberger, G. ; Winter, H.
Author_Institution :
Institut fÿr Allgemeine Physik, Technische Universitat, Vienna/Austria
Volume :
23
Issue :
2
fYear :
1976
fDate :
4/1/1976 12:00:00 AM
Firstpage :
967
Lastpage :
970
Abstract :
The ion charge state distribution (CSD) in a multiply charged ion source- (MCIS-) plasma can be determined from the spectrum of resonance transitions of excited neutral and ionised plasma particles. The principle of this method, which for noble gas ions involves vacuum-ultraviolet spectroscopy, is described and first measurements for a DUOPLASMATRON-ion source operated with He and Ar are presented.
Keywords :
Electron optics; Ion beams; Ion sources; Plasma applications; Plasma confinement; Plasma density; Plasma measurements; Plasma sources; Resonance; Stationary state;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1976.4328384
Filename :
4328384
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=823341
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