Title :
Texture of Cr interlayer in double CoCrTa thin films and effects of interlayer on the magnetic properties
Author :
Feng, Y.C. ; Laughlin, D.E. ; Lambeth, D.N.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
Multilayer magnetic recording thin-film media have attracted much attention because of their high signal-to-noise ratios. The authors investigated the crystallographic texture of the interlayer and the effects of the interlayer on the magnetic properties. It was found that: (1) when deposited at room temperature, the Cr interlayer has {110} texture, the same as the texture of the Cr underlayer; (2) when deposited at elevated temperatures, the Cr interlayer may have a different texture than that of the underlayer; (3) the Cr interlayer (only 25 Å thick) can either increase Hc or reduce S*, depending on the thickness of the CoCrTa layer; and (4) the substrate temperature affects Hc and S * dramatically
Keywords :
chromium; chromium alloys; cobalt alloys; ferromagnetic properties of substances; magnetic multilayers; magnetic recording; magnetic thin films; metallic thin films; sputter deposition; sputtered coatings; tantalum alloys; texture; 25 Å; CoCrTa alloys; CoCrTa thin films; CoCrTa-Cr; Cr interlayer; crystallographic texture; longitudinal thin film media; magnetic properties; signal-to-noise ratios; substrate temperature; Chromium; Crystallography; Magnetic films; Magnetic multilayers; Magnetic properties; Magnetic recording; Signal to noise ratio; Substrates; Temperature dependence; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on